Structure factor and topological bound of twisted bilayer semiconductors at fractional fillings
Published in Physical Review B, 2025
Recommended citation: Timothy Zaklama, Di Luo, and Liang Fu, "Structure factor and topological bound of twisted bilayer semiconductors at fractional fillings." Physical Review B, 2025. [https://doi.org/10.1103/wlvf-tdq1](https://doi.org/10.1103/wlvf-tdq1)
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